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Clinical Trial Details — Status: Withdrawn

Administrative data

NCT number NCT01282645
Other study ID # STU-CMF-C-16-204-01
Secondary ID
Status Withdrawn
Phase N/A
First received January 24, 2011
Last updated March 21, 2013
Start date July 2011
Est. completion date January 2012

Study information

Verified date March 2013
Source Synthes GmbH
Contact n/a
Is FDA regulated No
Health authority France: Afssaps - Agence française de sécurité sanitaire des produits de santé (Saint-Denis)France: Comité consultatif sur le traitement de l'information en matière de recherche dans le domaine de la santéFrance: Conseil National de l'Ordre des MédecinsFrance: Institutional Ethical Committee
Study type Observational

Clinical Trial Summary

The primary objective of this retrospective study is to evaluate the percentage of patients with device related adverse events (infection, rejection, dislocation, fracture of the implant) in the first 24 months after implantation.


Recruitment information / eligibility

Status Withdrawn
Enrollment 0
Est. completion date January 2012
Est. primary completion date January 2012
Accepts healthy volunteers No
Gender Both
Age group 18 Years and older
Eligibility Inclusion Criteria:

- Males or females age 18 years or over at the time of inclusion into the study

- Received a Synthes PSIĀ® made of PEEK intended for replacement of bony voids in the cranial/craniofacial skeleton at least 24 months before inclusion in the study

- Ability to obtain written informed consent from the recipient or the recipient's legal guardian

- Ability to comply with the procedures described in the protocol, including responding to simple questionnaires either by the recipient in person or by a next relative (spouse, parent) who lives with the recipient

Exclusion Criteria:

- Patient was contraindicated to receive a PSI made of PEEK at the time of implantation

Study Design

Observational Model: Cohort, Time Perspective: Retrospective


Related Conditions & MeSH terms


Intervention

Device:
PSI in PEEK
A Patient Specific Implant made of Polyether Ether Ketone to repair a cranial defect

Locations

Country Name City State
Austria AKH Allgemeines Krankenhaus Wien
Belgium Hôpital Erasme ULB Brussels
Chile Hospital San Pablo de Coquimbo Coquimbo
Chile Hospital de Trabajador de Santiago Santiago de Chile
Colombia Hospital San José Bogotá
Colombia Hospital Universitario San Ignacio Bogotá
Colombia Instituto Roosevelt Bogotá
Colombia Hospital Universitario del Valle Santiago de Cali
Costa Rica Hospital Clinica Biblica Cartago
Czech Republic University Hospital Ostrava
Denmark Rigshospital Copenhagen
Finland Oulu University Hospital Oulu
France Centre Hospitalier Universitaire Toulouse
Germany Universitätsklinikum Aachen Aachen
Germany HELIOS-Klinikum Emil von Behring Berlin
Germany Universitätsklinikum Düsseldorf Düsseldorf
Germany Clemenshospital Münster Heidelberg
Germany Universitätsklinikum Heidelberg Heidelberg
Portugal Hospital da Universidade Coimbra
Singapore National Neuroscience Institute Singapore
Spain Hospital 12 de Octubre Madrid
Spain Ramon y Cajal Hospital Madrid
Spain Clinica Universitaria Navarra Pamplona
Switzerland Inselspital Bern
Switzerland Hôpital Cantonal Universitaire Genève
Switzerland Centre Hospitalier Universitaire Vaudois Lausanne
Switzerland Kantonsspital St- Gallen St. Gallen
Switzerland Universitätsspital Zürich Zürich
United Kingdom Queen Victoria Hospital East Grinstead
United Kingdom The Walton Center Liverpool

Sponsors (1)

Lead Sponsor Collaborator
Synthes GmbH

Countries where clinical trial is conducted

Austria,  Belgium,  Chile,  Colombia,  Costa Rica,  Czech Republic,  Denmark,  Finland,  France,  Germany,  Portugal,  Singapore,  Spain,  Switzerland,  United Kingdom, 

Outcome

Type Measure Description Time frame Safety issue
Primary Device related adverse events Percentage of patients with the following device related adverse events:
infection
rejection
dislocation
fracture
0-24 months post initial implantation Yes
Secondary Explantation Explantation, as a result of a device-related adverse event or for another reason 0 months - study visit at least 24 months after implantation (or scheduled up to 3 months after the study visit) No
Secondary Cosmetic result Evaluation of the cosmetic result by the surgeon by means of a VAS 0-100, immediately after the surgery or until the patient was discharged from the hospital (any timepoint available) surgery - at discharge No
Secondary Cosmetic result Evaluation of the cosmetic result by the surgeon by means of a VAS 0-100, during the study visit, at least 24 months after implantation (see inclusion criteria) at the study visit, which is at least 24 months after implantation No
Secondary Clinical result Evaluation of the clinical result by the surgeon by means of a VAS 0-100, immediately after the surgery or until the patient was discharged from the hospital (any timepoint available) surgery - at discharge No
Secondary Clinical result Evaluation of the cosmetic result by the surgeon by means of a VAS 0-100, during the study visit, at least 24 months after implantation (see inclusion criteria) At the study visit, which is at least 24 months after implantation No
Secondary Pressure sensitivity Evaluation of the pressure sensitivity by the patient (or next of kin appreciation in case of severe disability) by means of a VAS 0-100, during the study visit, at least 24 months after implantation (see inclusion criteria) At the study visit, which is at least 24 months after implantation No
Secondary Heat / cold sensitivity Evaluation of the heat/cold sensitivity by the patient (or next of kin appreciation in case of severe disability) by means of a VAS 0-100, during the study visit, at least 24 months after implantation (see inclusion criteria) At the study visit, which is at least 24 months after implantation No
Secondary Cosmetic result Evaluation of the cosmetic result by the patient (or next of kin in case of severe disability) by means of a VAS 0-100, during the study visit, at least 24 months after implantation (see inclusion criteria) At the study visit, which is at least 24 months after implantation No
Secondary Event-free survival Number of months of event-free survival, in terms of device related adverse events:
Infection (superficial and/or deep) [Time frame 0 months - study visit]
Rejection of the implant [Time frame 0 months - study visit]
Dislocation of the implant [Time frame 0 months - study visit]
Fracture of the implant [Time frame 0 months - study visit]
0 months - at the study visit, which is at least 24 months after implantation Yes
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